Mar 24, 2023
2022-2023 Catalog
 Select a Catalog 2022-2023 Catalog 2021-2022 Catalog [ARCHIVED CATALOG] 2020-2021 Catalog [ARCHIVED CATALOG] Spring 2020 Catalog [ARCHIVED CATALOG] 2019-2020 Catalog [ARCHIVED CATALOG] Spring 2019 Catalog [ARCHIVED CATALOG] Fall 2018 Catalog [ARCHIVED CATALOG] Spring 2018 Catalog [ARCHIVED CATALOG] Fall 2017 Catalog [ARCHIVED CATALOG] Spring 2017 Catalog [ARCHIVED CATALOG] Fall 2016 Catalog [ARCHIVED CATALOG] Spring 2016 Catalog [ARCHIVED CATALOG] Fall 2015 Catalog [ARCHIVED CATALOG] Spring 2015 Catalog [ARCHIVED CATALOG] Fall 2014 Catalog [ARCHIVED CATALOG] Spring 2014 Catalog [ARCHIVED CATALOG] Fall 2013 Catalog [ARCHIVED CATALOG] Spring 2013 Catalog [ARCHIVED CATALOG] Fall 2012 Catalog [ARCHIVED CATALOG] 2011-2012 Catalog [ARCHIVED CATALOG] 2008-2010 Catalog [ARCHIVED CATALOG]
 HELP 2022-2023 Catalog Print-Friendly Page (opens a new window)

# IE 120 - Digital Electronics

Credit Hours: 3

Logic concepts using switches; binary and hex numbers; logic gates, drivers and interfaces; encoders and decoders; flip-flops, registers and counters; a simple adder; RAM and ROM memory and mass storage. Experiments include: simple logic circuits using switches and LEDs; integrated-circuit logic gates, encoders and decoders; registers and counters and a simple adder.

Course Outcomes
At the completion of the course, the student should be able to:

• perform calculations and base conversions in the binary, decimal and hexadecimal number systems;
• relate logic diagrams to Boolean expressions, truth tables and state tables;
• breadboard and troubleshoot digital logic circuits;
• analyze combinational and sequential logic circuits;
• relate IEEE and MIL-STD logic symbols to their logic function;
• identify and explain the behavior of combinational circuits including encoders, decoders, tri-state buffers, arithmetic circuits, multiplexers and demultiplexers;
• identify and explain the behavior of sequential circuits including latches, flip-flops, registers and counters; and
• prepare a laboratory report based on data collected from tests on digital systems.

Concurrent Registration: MT 121
F (N)